Quantitative XPS analysis of PEG-modified silicon surfaces
Article Abstract:
X-ray photoelectron spectroscopy (XPS) is used to understand and analyze poly(ethylene glycol) (PEG) films on silicon bio-microsystems. The standard overlayer method is used to calculate the thickness of the film using the intensities of Si2p peaks before and after PEG modification.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
Silicon & Inorganic Compounds, Measurement, Photoelectron spectroscopy, Photochemistry, Silicon compounds
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
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Hydrogen chemisorption on Al2O3-supported gold catalysts
Article Abstract:
Hydrogen dissociatively adsorbs on the gold atoms of Au/AL2O3 catalyst prepared by impregnation and deposition-precipitation. The dissociative and adsorption of hydrogen is limited to the gold atoms on corner and edge positions.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
Switzerland, Industrial inorganic chemicals, not elsewhere classified, Aluminum Oxide, Gold Compounds, Chemical properties
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
User Contributions:
Comment about this article or add new information about this topic:
Subjects list: Research
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