Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy

Article Abstract:

The boundary element method (BEM) was used in mapping the current response of the scanning electrochemical microscope for a range of tip and substrate geometries. Simulations were performed to quantify the diffusional fields around tip electrodes of disk, hemispherical and cone geometries. Two-dimensional simulations investigate the impact of the current flowing at the tip electrode as it is brought toward conducting and nonconducting surfaces that are either infinitely flat or spherically deformed. Three-dimensional BEM simulations analyzed the current response for approach curves where the tip microdisk electrode is not parallel to the substrate surface.

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Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy

Article Abstract:

Boundary element method (BEM) simulations were conducted for a number of scanning electrochemical microscopy applications. Computations quantified the consequences of the surrounding shield for a range of tip geometries and provide three-dimensional images of electrodes embedded in substrate surfaces. Approach curves were shown for a range of experimentally utilized probes, including the sphere-cap electrode. The BEM was also employed to generate a line scan across the interface between a conducting and nonconducting substrate for various tip geometries.

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Computational electrochemistry: the boundary element method

Article Abstract:

A study was conducted to characterize the boundary element method as an effective technique for evaluating electrochemical processes. The theory and numerical concerns associated with the development of dimensional diffusional frameworks were examined. The versatility and efficiency of numerical steps were analyzed against the number of electrode geometries. In addition, current density changes during the flattening of the hemispherical electrode were characterized.

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