Low-energy electron damage to condensed-phase deoxyribose analogues investigated by electron stimulated desorption of H- and electron energy loss spectroscopy
Article Abstract:
The low-energy electron-induced damage of three deoxyribose analogues condensed at 27 K on polycrystalline Pt was investigated by electron stimulated desorption of H- and high-resolution electron energy loss spectroscopy. The sugar-like analogues studied are tetrahydrofuran, 3-hydroxytetrahydrofuran and alpha-tetrahydrofurfuryl alcohol. Results suggest that the attack of the deoxyribose backbone in cellular DNA by 6-14 eV secondary electrons will lead to strand lesions via either dissociative electron attachment or resonance-enhanced cleavage of ring bonds.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 1999
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Electron-stimulated desorption of H- from condensed-phase deoxyribose analogues: dissociative electron attachment versus resonance decay into dipolar dissociation
Article Abstract:
Research into the low-energy electron-induced degradation of a series of model compounds representative of the deoxyribose backbone of DNA is presented. It was established that the 23-eV peak arises mainly from decay of a transient anion into an electronic excited state which dissociates into H- and the corresponding positive ion radical.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
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Alteration of protein constituents induced by low-energy (<40 eV) electrons. III. The aliphatic amino acids
Article Abstract:
The effect of low-energy (<40 eV) electrons on protein constituents is discussed. It is shown that the slow electrons dissociate the aliphatic amino acids glycine, alanine, and cysteine and produce H(super -) anions as the most intense fragment via simple bond cleavage.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
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