Superlattices of metal and metal-semiconductor quantum dots obtained by layer-by-layer deposition of nanoparticle arrays

Article Abstract:

X-ray diffraction, photoelectron spectroscopy and scanning tunneling microscopy were used to study metal quantum dot superlattices formed by arrays of Pt or Au nanoparticles and obtained by layer-by-layer deposition using dithiols as cross-linkers. The core-level intensity in the Au region was found to decrease with each deposition. The Pt core-level intensity also decreased after the deposition of the CdS nanoparticles. A Pt-CdS-Pt-type heterostructure was obtained by reversing the order of deposition of the Pt and CdS particle.

Platinum, Particles, Particulate matter, Quantum chemistry, Superlattices as materials, Superlattices

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Magic nuclearity giant clusters of metal nanocrystals formed by mesoscale self assembly

Article Abstract:

Transmission electron microscopy was used for identifying the magic nuclearity giant clusters formed by the mesoscale-self-assembly of Pd nanocrystals of 2.5 nm diameter. The clusters of metal nanocrystals can be bound by the same laws like the principle of self-similarity, which give special stability magic numbered nanocrystals.

Science & research, Usage, Electric properties, Nanotechnology, Transmission electron microscopes, Epitaxy

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Nature and properties of ultrathin naocrystalline gold films formed at the organic-aqueous interface

Article Abstract:

Ultrathin nanocrystalline films of gold formed at different temperatures at the organic-aqueous interface were investigated by X-ray diffraction, electron microscopy, atomic force microscopy, and electronic spectroscopy. The films are smooth and continuous over relatively large length scales and are generally ~100 nm thick.

Semiconductors and related devices, Semiconductor and Related Device Manufacturing, Primary nonferrous metals, not elsewhere classified, Primary Smelting and Refining of Nonferrous Metal (except Copper and Aluminum), Thin Film Materials, Gold, Analysis, X-rays, X-ray diffraction, Thin films, Dielectric films, Atomic force microscopy, Properties, Structure

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