Fault injection spot-checks computer system dependability
Article Abstract:
The Rifle fault injection system developed at the University of Coimbra in Portugal uses the insertion version of the pin-level fault injection technique, but it borrows an idea from digital logic analyzers in which dedicated logic intercepts signals at the pins of the target device to trigger faults and record their effects. Injecting faults is intended to test fault-tolerance mechanisms and to estimate system performance. The system is first injected with the type of faults anticipated in the design, which comprise the fault model, but there is no way to anticipate the faults likely to be encountered in real-world use. The four dimensions around which fault models are designed are trigger, location, type and duration. Simulation-based fault injection is useful early in the system development process, particularly for evaluating the dependability of critical systems, but accurate results require detailed models, and simulation runs can last a long time.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1999
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Superchips for supercomputing
Article Abstract:
The semiconductor industry is beginning to use different types of materials for its supercomputer CPUs. The industry used to rely on silicon emitter-coupled logic (ECL), but has recently seen competition from silicon bipolar complementary metal-oxide-semiconductor (BiCMOS) integrated circuits and from gallium arsenide. Innovations in these three technologies will continue to make up the bulk of the chip industry for several years, while new materials and new technologies will probably lack the necessary power to become commercially viable. Another form of ECL, known as emitter collector dotted logic (ECDL), is also a potential candidate for future use in the supercomputer industry. The trend toward massively parallel processing (MPP) in supercomputers may benefit silicon logic in the near future.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1992
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The broad sweep of integrated microsystems
Article Abstract:
Researchers are using semiconductor production techniques to combine mechanical, chemical and optical structures with microcircuits, and some say the results could signify the start of a second silicon revolution. Complex structures are envisioned, such as, for example, an entire chemical laboratory on a chip. Biomimetic microsystems are foreseen, with capabilities that emulate functions such as sensing, thinking and communicating.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1998
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