A theoretical investigation of the yield-to-damage enhancement with polyatomic projectiles in organic SIMS
Article Abstract:
It is observed that polyatomic projectiles have the potential to improve the sensitivity of organic secondary ion mass spectrometry by increasing the yield without a comparable increase in damage to the sample. Molecular dynamics simulations of the high energy bombardment of an organic film are performed with the purpose of understanding how the yield-to-damage ratio is enhanced with polyatomic projectiles.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
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Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid
Article Abstract:
The particle-induced desorption of polystyrene (PS) tetramers from a molecular solid sample is studied using molecular dynamics simulations. A PS monolayer on silver and a thick (45 angstrom) PS sample is bombarded by 0.5-ke V Ar projectiles, at a polar angle of 45 degree Celcius, to identify the specifics of bulk organic sample sputtering.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
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Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles
Article Abstract:
Secondary ion mass spectrometry is the most used mass spectrometric technique for the surface analysis of molecular solids composed of organic, polymeric and biomolecular species. By increasing the projectile ion mass and kinetic energy, the secondary ion yields increase due to improved momentum transfer to the surface.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
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