Spectroscopic ellipsometry investigation of the swelling of poly(dimethylsiloxane) thin films with high pressure carbon dioxide
Article Abstract:
Ellipsometry is used to study a variety of polymer thin film phenomena occurring in both air and liquid solvents including adsorption of polymers and surfactants. Pressure-induced birefringence of the fused-silica windows was addressed in the model calculations and corrections were found to be successful for a thermal oxide reference wafer and the poly(dimethylsiloxane) (PDMS) films.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2001
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A comparison between light reflectometry and ellipsometry in the Rayleigh regime
Article Abstract:
The adsorption of Rayleigh particles in terms of particle radius and surface coverage with thin island film theory with both scanning angle light reflectometry and ellipsometry around the Brewster angle is analyzed. An additional uniformity parameter can be extracted out of the experimental reflectivity data in the comparison between both techniques.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2000
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Dynamic in situ spectroscopic ellipsometry of the reaction of aqueous iron(II) with 2,2'-bipyridine in a thin Nafion film
Article Abstract:
Dynamic in situ spectroscopic ellipsometry studies of the chemical reaction between ferrous ion and 2,2'-bipyridine (bpy) in a thin film are presented. The work exemplifies the usefulness of spectroscopic ellipsometry in monitoring the kinetics of a chemical reaction in situ, and the changes in the film physical properties under dynamic conditions.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
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