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Fourier transform infrared spectroscopy using polarization modulation and polarization selective techniques for internal and external reflection geometries: Investigation of self-assembled octadecylmercaptan on a thin gold film

Article Abstract:

A combination of polarization modulation (PM) and Fourier transform infrared reflection-absorption spectroscopy (FT-IRRAS) reflection-absorption is possible for both external reflection and attenuated total internal reflection (ATR) configurations. The results, including IR spectra of octadecylmercaptan (ODM) on Au are prescribed for PM as well as for parallel (p) and perpendicular (s) polarization selective detection schemes, and for both external reflection and ATR experimental geometries.

Author: Roy, D., Hutter, E., Assiongbon, K.A., Fendler, J.H.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003
Thermal properties, Fourier transform infrared spectroscopy, Polarization (Electricity), Reflection (Geometry)

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Surface-enhanced infrared ellipsometry of self-assembled undecanethiol and dodecanethiol monolayers on disordered gold nanoisland substrates

Article Abstract:

The important features of surface-enhanced infrared spectroscopic ellipsometry (SEIRSE), which serves as a useful vibrational spectroscopic tool for studying structural and electronic properties of self-assembled monolayers (SAMs) on Au, are described. The results show that SEIRSE is sensitive to subtle vibrational signatures of the differently oriented terminal methyls of these two homologous alkanethiol SAMs.

Author: Roy, D., Hutter, E., Fendler, J.H., Bradford, D.C.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
Semiconductors and related devices, Semiconductor and Related Device Manufacturing, New York, Thin Film Materials, Electric properties, Thin films, Optical properties, Dielectric films, Infrared spectroscopy, Structure

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Infrared ellipsometry of self-assembled octadecylmercaptan on gold films and nanoislands: Effects of thickness and morphology of the gold layer

Article Abstract:

The external reflection geometry and a three-phase system are commonly used by infrared spectroscopic ellipsometry (IRSE) of organic self-assembled monolayers (SAMs). A report is presented, which shows how IRSE measurements involving organic SAMs are affected by the thickness and surface roughness of the substrate Au layer.

Author: Roy, D., Hutter, E., Fendler, J.H., Bradford, D.C., Assionghon, K.A.
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2004
Science & research, Research, Monomolecular films, Substrates

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Subjects list: Analysis, Usage, Ellipsometry
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