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Chemicals, plastics and rubber industries

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Abstracts » Chemicals, plastics and rubber industries

Structural characterization of nanosized CeO2-SiO2, CeO2-TiO2, and CeO2-ZrO2 catalysts by XRD, Raman, and HREM techniques

Article Abstract:

X-ray diffraction (XRD), Raman spectroscopy, BET surface area, thermogravimetry, and high resolution transmission electron microscopy (HREM) was used to investigate structural characteristics of nanosized ceria-silica, ceria-titania, and ceria-zirconia mixed oxide catalysts. The investigated oxides were obtained by soft chemical routes with ultrahighly dilute solutions and were subjected to thermal treatments from 773 to 1073 K.

Author: Reddy, Benjaram M., Khan, Ataullah, Loridant, Stephane, Volta, Jean-Claude, Lakshmanam, Pandian, Aouine, Mimoun
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
Primary Smelting and Refining of Nonferrous Metal (except Copper and Aluminum), Cesium, Silicon & Inorganic Compounds, Zirconium Compounds, Titanium compounds, Silicon compounds

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Raman spectroscopic study on the structure in the surface and the bulk shell of [Ce.sub.x][Pr.sub.1-x][O.sub.2-delta] mixed oxides

Article Abstract:

The difference between the surface and the bulk shell of [Ce.sub.x][Pr.sub.1-x][O.sub.2-delta] mixed oxides is studied by Raman spectroscopy with four different excitation lasers. The results have shown that the surface region and the bulk shell are different and the thickness of the surface layer with rich Pr increases with the decrease in the Ce content.

Author: Meng-Fei Luo, Zong-Lan Yan, Ling-Yun Jin
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
Structure, Praseodymium

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Structural characterization of CeO(sub 2)-MO(sub 2) (M = Si(super 4+), Ti(super 4+), an Zr(super 4+)) mixed oxides by Raman spectroscopy, X-ray photoelectron spectroscopy, and other techniques

Article Abstract:

Microstructure evolution of ceria-based mixed oxides CeO(sub 2)-MO(sub 2) (M = Si(super 4+), Ti(super 4+), an Zr(super 4+)) after thermal treatments in the temperature range of 773-1073 K are investigated by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and other techniques.

Author: Kobayashi, Tetsuhiko, Reddy, Benjaram R., Khan, Ataullah, Yamada, Yusuke, Loridant, Stephane, Volta, Jean-Claude
Publisher: American Chemical Society
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003

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Subjects list: Chemical properties, Usage, Oxides, Raman spectroscopy, Cerium
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