KGD testing in automotive applications
Article Abstract:
The development of known good die (KGD) technology required engineers to create an effective mechanism to invert a fragile die during the inspection process. KGD technology has been pursued by companies such as tester manufacturer LTX, International Rectifier (IR), a supplier of power semiconductor systems solutions, and Ismeca, a manufacturer of tape-and-reel equipment. These companies, addressing another problem in KGD technology, formed a cooperative effort to develop a test nest and multiple test stations.
Comment:
The development of known good die (KGD) technology is being pursued by several companies cooperating to overcome problems
Publication Name: Semiconductor International
Subject: Electronics and electrical industries
ISSN: 0163-3767
Year: 1998
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CMOS camera-on-a-chip
Article Abstract:
CMOS active-pixel digital image sensors (APS) is seen as a prospective alternative to charge-couple devices (CCD), which are limited in terms of capabilities needed for interplanetary spacecraft. CMOS camera-on-a-chips are also more cost effective as they utilize the same production process for most microprocessors and memory chips. The development of APS technology is considered important since CCDs rendered incompatible with advanced CMOS devices and circuits.
Publication Name: Semiconductor International
Subject: Electronics and electrical industries
ISSN: 0163-3767
Year: 1999
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