User-programmable gate arrays

Article Abstract:

A gate array with high flexibility makes the job of designing, updating, or changing the logic circuitry much faster. These kind of integrated circuit (IC) gates are interconnected under software control, which is downloaded into local memory cells from a user-written program. This allows dense arrays of gates to be arranged and rearranged by the system designer via the software, rather than by manufacturer fabrication. User-programmable ICs have found a market in industrial applications, automation systems, workstations, instrumentation, and telecommunication equipment. Designers prefer user-programmable ICs because they leave room for nonstandard logic functions that give a product its personality. These flexible chips save money in simulation time and computer charges, test programs, and mask fees.

Application specific integrated circuits, Gate arrays, Performance improvement (Computers), Performance Improvement, Custom IC, Software Validation

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Optics and electronics are living together

Article Abstract:

Optoelectronic ICs with more advanced structures and fabrication processes are expected to supplant by the mid-1990s the optical-fiber communication devices currently in use. Matsushita Electric Industrial Co is the first to market optoelectronic receivers and transmitters for optical telephone systems as well as for cable television systems. Other companies are developing similar products to near-commercial status or are concentrating on experimental higher-performance versions. The greatest advantage of optoelectronic chips is their high data-transfer rates, potentially up to 5 gigabits per second. Other pluses are their low noise, their multi-function capabilities, their small size and low cost. The demand is expected to total $5 billion a year by 1994.

Product information, Fiber optics, Matsushita Electric Industrial Company Ltd., Lasers, Optoelectronic devices, Laser, Communications protocols, Signal processing, Data Transfer Rate, technical

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• Abstracts: A parallel architecture comes of age at last. Testability on TAP: testing loaded digital logic boards becomes much easier with a standard test access port, or TAP, meant for boundary-scan tests

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