Virtual-fab mentality cuts cycle time by more than 60%
Article Abstract:
Texas Instruments Semiconductor Group offered cross-functional, cross-fab training to its workforce in all its facilities to facilitate cooperation among the different plants for the improvement of their cycle times and to eradicate competition between the fabs or plants. This approach helped in the management of time constraints and order-fulfillment problems in the different plants of the company. The result of this type of training was the reduction of overall cycle time by more than 60%, and the increase of throughput by 35% and on-time delivery by 98%.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1996
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Mentors cut corporate cycle times by 65%
Article Abstract:
Texas Instruments Inc Semiconductor Group (SCG) has focused on training a group of employees in a desire to attain waste reduction and productivity improvement. The trained employees then begun the worldwide network of mentors who will guide and train the rest of the corporation adopting a variety of new best-practice methods. SCG's motivation to change coupled with strong sponsorship from the company president are expected to provide the basis in which the project could succeed.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1997
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Live video enhances semiconductor inspection
Article Abstract:
Parallax Graphics Inc has developed a VideoView board which allows the viewing of scanning electron microscope (SEM) images in real time. By using the Parallax board, SEM images can be stored for later analysis. The VideoView board thus enhances the process of semiconductor inspection. Thus, it it now possible to have SEMs which produce magnified images 1,000 to one million times its actual size.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1992
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