EDIF grows up
Article Abstract:
Electronic Design Interchange Format (EDIF) is a standard data format developed by a consortium of electronic design automation vendors and semiconductor vendors. EDIF translators convert data from a given design tool into EDIF as a standard format, and from EDIF into whatever form is needed by another design tool. Electronics companies welcome EDIF because when engineers move from one step in the design process to another step, they often find tools incompatible. The first version of EDIF, released in May 1984, has undergone several revisions. The American National Standards Institute accepted EDIF as an industry standard in 1988. The present version, EDIF 2.0, was published by the Electronic Industries Association in May 1987. Thirty-three EDIF translators and other software tools are listed in this directory. Information includes product name, manufacturer, price, platform, operating system, translator type, source and general comments.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1990
User Contributions:
Comment about this article or add new information about this topic:
Expert opinion: instruments bring users more information than ever
Article Abstract:
Improved displays and increased computational abilities, due to digital signal processing (DSP), are making test and measurement equipment much more flexible and powerful. However, their greater complexity makes built-in self-testing highly desirable. The increased DSP capabilities are enabling the design of modular instrumentation that offer more and new test and measurement functions and rapidly perform more meaningful measurements. The increasing instrument sophistication is requiring improved displays with multiple lines, flexible menus and more meaningful content. New digital architectures such as the VXIbus are easing the integration of multiple digital instruments. Built-in self-testing becomes important to ensure the functionality and accuracy of the digital test and measurement equipment and to isolate possible problems.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1992
User Contributions:
Comment about this article or add new information about this topic:
- Abstracts: Succeeding with virtual instruments. Ten ways DSOs put more power in your hands. Virtual instruments meet custom test needs
- Abstracts: Expert opinion: traditional mainframes and supercomputers are losing the battle. Massive parallelism rivals supercomputers
- Abstracts: An instrument that isn't really. Evaluating nonlinear models for microwave GaAsFETs
- Abstracts: Computer industry at a troublesome juncture. An opening for Open Systems
- Abstracts: Selecting math coprocessors. How ICs impact workstations