Cutting the high cost of testing
Article Abstract:
The National Institute of Standards and Technology (NIST) has developed a comprehensive approach to testing analog and mixed-signal circuit designs that balances the cost of testing and the generation of thorough results. The technique is based on the fact that the behavior of many devices is determined by a relatively small set of underlying variables that govern the results of many measurements. The method is an extension of the optimal design of experiments technique coupled with the concept of empirical modeling; it is much more computationally efficient than the optimal design technique while still yielding nearly as good results. The method is being used to test a diverse range of devices and instruments in addition to analog-to-digital converters, including amplifier-attenuator networks, filters and multi-range instruments.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 1991
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Nano particles without macroproblems: quick and dirty advice for keeping nanotech clean
Article Abstract:
There is growing evidence that nanotechnological chemicals have negative environmental and health effects. The toxicity of nanoparticles increases disproportionately as they get smaller. The electronics industry should lead in investigating and preventing these effects.
Publication Name: IEEE Spectrum
Subject: Engineering and manufacturing industries
ISSN: 0018-9235
Year: 2007
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