Charging/discharging of Au (core)/silica (shell) nanoparticles as revealed by XPS

Article Abstract:

A study reveals that by controlling the charging/discharging of gold (core)/silica (shell) nanoparticles during their analysis by XPS, it is detected that in both steady-state and time-resolved fashions, the potential developed due to the positive charges on the core -shell nanoparticles/nanocapacitors. The method is simple and provides a noncontact analytical detection system that also reveals the location and the chemical identity of the medium where the charges reside within the nanostructures.

Industrial sand, Silica & Silica Sand, Industrial Sand Mining, Gold Compounds, Electric properties, Silica, Nanoparticles

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X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO(sub 2) matrix

Article Abstract:

X-ray photoelectron spectroscopy (XPS) is used to analyze the silicon nanoclusters Si(nc) in a SiO(sub 2) matrix prepared by the plasma-enhanced chemical vapor deposition technique. The results show no measurable binding energy difference between the corresponding Si2(sub p) peaks and hence suggest that the differential charging is the greatest obstacle to extract the size-dependent binding energy shifts axis XPS.

Methods, Clusters (Chemistry), Chemical vapor deposition, Structure, Chemical properties, Chemical vapour deposition

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XPS studies of SiO2/Si system under external bias

Article Abstract:

Thermally grown SiO2 layers on Si (100) substrate are subjected to different external voltage bias during XPS analysis to induce changes in the measured binding energy difference Si(super 4+) and Si(super 0) in Si2p and Si(sub KLL) regions. The application of negative d.c. bias increases the binding energy difference, whereas positive bias decreases it.

Silicon, Analysis, Binding energy, Atomic properties

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