A new QC tool for quantitative surface analysis
Article Abstract:
Optical scatterometry provides a quick and noncontact assessment of surface quality. With the emergence of inexpensive hand-held devices, the technique rapidly grew in popularity in a variety of applications involving rapid quantitative surface analysis. Optical scatterometry instruments can measure surface finish parameters such as RMS and Ra ranging from 0.04 microinch to tenths of a microinch and can perform multiple measurements on areas covering several millimeters in less than a second. It can also be made to create surface maps and detect various surface defects, blemishes or dust.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 1992
User Contributions:
Comment about this article or add new information about this topic:
On the Horizon
Article Abstract:
Cognex Corp will introduce the In-Sight 2000 machine vision system in Apr 2000 for approximately $5,000.
Publication Name: Quality
Subject: Engineering and manufacturing industries
ISSN: 0360-9936
Year: 2000
User Contributions:
Comment about this article or add new information about this topic:
- Abstracts: A PROLOG simulator for interactive flexible manufacturing systems control. CROGRO: An Interactive Forest Growth Simulator
- Abstracts: Linear control analysis on a PC. Interactive visualization
- Abstracts: A dynamic approach to operations management: an alternative to static optimization. A quantitative approach to estimate the size of the time buffer in the theory of constraints
- Abstracts: A case for semiautomatic optical measurement. High-temperature periscope takes the heat
- Abstracts: First-pass yield increases - quality declines. Measure process capability when Cp won't work